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| Source: | Contracts Finder |
| Buyer: | Northumbria University at Newcastle |
| Main Category: | Goods |
| Procurement Method: | Open procedure |
| Tender Status: | Complete |
| Estimated Value (ex. VAT): | £1,000,000 |
| Release Date: | 26 October 2023 |
| Application Deadline: | 24 November 2023 |
The university is looking to purchase a focused ion beam secondary electron microscope (FIB-SEM) that can handle various samples from different fields including semiconductors, energy materials (such as batteries and photovoltaics), civil engineering, metallurgy, etc. The instrument must excel in analysing thin film multilayer structures and devices (e.g. thin film solar cells), which typically consist of layers ranging from 1 micron to less than 20nm thick, requiring 3-dimensional microstructure analysis. The instrument must have excellent imaging capabilities, as well as the ability to handle Energy Dispersive X-ray Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) investigations. We also require a TOF-SIMS detector and electron beam-induced current (EBIC) electronics.
Published contracts in the last 12 months
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£26.7m
total value
£1,778,133
average contract size
Typical categories
Pipeline status
Not addedContract imported automatically · AI writes the response
Application Deadline
24 November 2023
Closed
Estimated Value
£1,000,000
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Book a free consultation →| Procurement ID (OCID): | ocds-b5fd17-610d87c4-350f-461b-9b74-064e600f7db4 |
| Notice Reference: | af02efff-a969-4014-9f4f-76955dc5afe5-692416 |
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